Investigation of the Impact of Neutron Irradiation on SiC Power MOSFETs Lifetime by Reliability Tests
Abstract
:1. Introduction
2. Experimental
2.1. Electrical Characterization
2.2. HTGB and HTRB Tests
- HTRB = 0 V, = 1200 V
- HTGB1 = +22 V, = 0 V
- HTGB2 = −10 V, = 0 V
3. Results
3.1. Electrical Characterization of the Survived Samples
3.2. Weibull Analysis of the Irradiation Failures
3.3. HTGB and HTRB Tests on Survived GEN3 SiC MOSFETs
4. Discussion
5. Conclusions
Author Contributions
Funding
Acknowledgments
Conflicts of Interest
References
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(V) under Irradiation (V) | FIT Sea Level [95% CI Bounds] | FIT 12 km [95% CI Bounds] |
---|---|---|
800 | 0.01 | 4.6 |
850 | 0.09 | 42 |
Symbol | Unit | Parameter | Condition at = 25 °C |
---|---|---|---|
nA | gate leakage current | 10 V, 0 V | |
nA | gate leakage current | 22 V, 0 V | |
V | gate-source threshold voltage | 1 mA, | |
A | drain leakage current | 1.2 kV, = 0 V | |
V | drain-source breakdown voltage | 1 mA, = 0 V | |
V | drain-source on-state voltage | 120 A, = 18 V | |
V | source-drain diode voltage | 10 A, = 0 V |
Power Device | (V) | (V) (under Irradiation) | Lower 95% CI | Upper 95% CI | |
---|---|---|---|---|---|
SiC-SCT35N65G2V | 650 | 480 | 1.1 | 0.86 | 1.50 |
SiC-SCT130N120G3 | 950 | 1200 | 1.2 | 0.87 | 1.50 |
Si-STB45N40DM2AG | 325 | 400 | 0.95 | 0.70 | 1.30 |
IGBT-STGW8M120DF3 | 850 | 1200 | 1.20 | 0.79 | 1.80 |
Failures/Samples | |||||||
---|---|---|---|---|---|---|---|
Test | Standard Reference | Conditions | n° Samples | Step | No Irr | ST | AB |
HTRB | MIL-STD-750-1M1038 | = 200 °C, BIAS = 1200 V | 23 | 168 h | 0/10 | 0/6 | 0/7 |
500 h | 0/10 | 0/6 | 0/7 | ||||
1000 h | 0/10 | 0/6 | 0/7 | ||||
HTGB1 | JESD22A-108 | = 200 °C, BIAS = +22 V | 17 | 168 h | 0/10 | 0/4 | 0/3 |
500 h | 0/10 | 0/4 | 0/3 | ||||
1000 h | 0/10 | 0/4 | 0/3 | ||||
HTGB2 | JESD22A-108 | = 200 °C, BIAS = −10 V | 19 | 168 h | 0/10 | 0/6 | 0/3 |
500 h | 0/10 | 0/6 | 0/3 | ||||
1000 h | 0/10 | 0/6 | 0/3 |
HTRB | |||||||
---|---|---|---|---|---|---|---|
Parameter | Median | Max Drift | Spec. Drift | Datasheet Limit | |||
0 h | 168 h | 500 h | 1000 h | ||||
@ −10 V | <10 nA | <10 nA | <10 nA | <10 nA | - | 5 times initial value | <100 nA |
@ +22 V | <10 nA | <10 nA | <10 nA | <10 nA | - | 5 times initial value | <100 nA |
@ 1 mA | 2.58 V | 2.48 V | 2.47 V | 2.46 V | <5% | <20% | >1 V, <6 V |
@ 1.2 kV | 0.44 A | 0.40 A | 0.38 A | 0.32 A | - | 5 times initial value | <10 A |
@ 1 mA | 1.73 kV | 1.73 kV | 1.73 kV | 1.74 kV | <2% | <20% | >1.2 kV, <1.9 kV |
@ = 120 A 18 V | 2.16 V | 2.14 V | 2.15 V | 2.12 V | <2% | <20% | >1.5 V, <4.14 V |
@ 6 A | 2.06 V | 2.04 V | 2.04 V | 2.04 V | <1% | <20% | <5 V |
HTGB1 | |||||||
---|---|---|---|---|---|---|---|
Parameter | Median | Max Drift | Spec. Drift | Datasheet Limit | |||
0 h | 168 h | 500 h | 1000 h | ||||
@ −10 V | <10 nA | <10 nA | <10 nA | <10 nA | - | 5 times initial value | <100 nA |
@ +22 V | <10 nA | <10 nA | <10 nA | <10 nA | - | 5 times initial value | <100 nA |
@ 1 mA | 2.76 V | 2.92 V | 3.02 V | 3.02 V | <5% | <20% | >1 V, <6 V |
@ 1.2 kV | 0.30 A | 0.29 A | 0.29 A | 0.06 A | - | 5 times initial value | <10 A |
@ 1 mA | 1.78 kV | 1.78 kV | 1.78 kV | 1.74 kV | <2% | <20% | >1.2 kV, <1.9 kV |
@ = 120 A 18 V | 2.32 V | 2.29 V | 2.35 V | 2.47 V | <2% | <20% | >1.5 V, <4.14 V |
@ 6 A | 2.16 V | 2.20 V | 2.23 V | 2.08 V | <1% | <20% | <5V |
HTGB2 | |||||||
---|---|---|---|---|---|---|---|
Parameter | Median | Max Drift | Spec. Drift | Datasheet Limit | |||
0 h | 168 h | 500 h | 1000 h | ||||
@ −10 V | <10 nA | <10 nA | <10 nA | <10 nA | - | 5 times initial value | <100 nA |
@ +22 V | <10 nA | <10 nA | <10 nA | <10 nA | - | 5 times initial value | <100 nA |
@ 1 mA | 2.94 V | 3.20 V | 3.22 V | 3.21 V | <5% | <20% | >1 V, <6 V |
@ 1.2 kV | 0.40 A | 0.41 A | 0.41 A | 0.42 A | - | 5 times initial value | <10 A |
@ 1 mA | 1.76 kV | 1.76 kV | 1.76 kV | 1.76 kV | <2% | <20% | >1.2 kV, <1.9 kV |
@ = 120 A 18 V | 2.27 V | 2.36 V | 2.40 V | 2.40 V | <2% | <20% | >1.5 V, <4.14 V |
@ 6 A | 2.20 V | 2.30 V | 2.31 V | 2.30 V | <1% | <20% | <5V |
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Principato, F.; Allegra, G.; Cappello, C.; Crepel, O.; Nicosia, N.; D′Arrigo, S.; Cantarella, V.; Di Mauro, A.; Abbene, L.; Mirabello, M.; et al. Investigation of the Impact of Neutron Irradiation on SiC Power MOSFETs Lifetime by Reliability Tests. Sensors 2021, 21, 5627. https://doi.org/10.3390/s21165627
Principato F, Allegra G, Cappello C, Crepel O, Nicosia N, D′Arrigo S, Cantarella V, Di Mauro A, Abbene L, Mirabello M, et al. Investigation of the Impact of Neutron Irradiation on SiC Power MOSFETs Lifetime by Reliability Tests. Sensors. 2021; 21(16):5627. https://doi.org/10.3390/s21165627
Chicago/Turabian StylePrincipato, Fabio, Giuseppe Allegra, Corrado Cappello, Olivier Crepel, Nicola Nicosia, Salvatore D′Arrigo, Vincenzo Cantarella, Alessandro Di Mauro, Leonardo Abbene, Marcello Mirabello, and et al. 2021. "Investigation of the Impact of Neutron Irradiation on SiC Power MOSFETs Lifetime by Reliability Tests" Sensors 21, no. 16: 5627. https://doi.org/10.3390/s21165627
APA StylePrincipato, F., Allegra, G., Cappello, C., Crepel, O., Nicosia, N., D′Arrigo, S., Cantarella, V., Di Mauro, A., Abbene, L., Mirabello, M., & Pintacuda, F. (2021). Investigation of the Impact of Neutron Irradiation on SiC Power MOSFETs Lifetime by Reliability Tests. Sensors, 21(16), 5627. https://doi.org/10.3390/s21165627