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Journal: Sensors, 2020
Volume: 20
Number: 6660
Article:
Quantitative X-ray Channel-Cut Crystal Diffraction Wavefront Metrology Using the Speckle Scanning Technique
Authors:
by
Lian Xue, Hongxin Luo, Qianshun Diao, Fugui Yang, Jie Wang and Zhongliang Li
Link:
https://www.mdpi.com/1424-8220/20/22/6660
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