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Article

Analysis of Disparity Information for Depth Extraction Using CMOS Image Sensor with Offset Pixel Aperture Technique †

1
School of Electronics Engineering, Kyungpook National University, Daegu 41566, Korea
2
Center for Integrated Smart Sensors, KAIST, Daejeon 34141, Korea
*
Author to whom correspondence should be addressed.
This paper is an extended version of “Extraction of Disparity Information Using Pixels with Integrated Apertures” published in the Proceedings of 2018 IEEE International Conference on Imaging Systems and Techniques (IST), Krakow, Poland, 16–18 October 2018.
Sensors 2019, 19(3), 472; https://doi.org/10.3390/s19030472
Received: 20 December 2018 / Revised: 22 January 2019 / Accepted: 22 January 2019 / Published: 24 January 2019
A complementary metal oxide semiconductor (CMOS) image sensor (CIS), using offset pixel aperture (OPA) technique, was designed and fabricated using the 0.11-µm CIS process. In conventional cameras, an aperture is located on the camera lens. However, in a CIS camera using OPA technique, apertures are integrated as left-offset pixel apertures (LOPAs) and right-offset pixel apertures (ROPAs). A color pattern is built, comprising LOPA, blue, red, green, and ROPA pixels. The disparity information can be acquired from the LOPA and ROPA channels. Both disparity information and two-dimensional (2D) color information can be simultaneously acquired from the LOPA, blue, red, green, and ROPA channels. A geometric model of the OPA technique is constructed to estimate the disparity of the image, and the measurement results are compared with the estimated results. Depth extraction is thus achieved by a single CIS using the OPA technique, which can be easily adapted to commercial CIS cameras. View Full-Text
Keywords: CMOS image sensor; disparity information; depth extraction CMOS image sensor; disparity information; depth extraction
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MDPI and ACS Style

Choi, B.-S.; Lee, J.; Kim, S.-H.; Chang, S.; Park, J.; Lee, S.-J.; Shin, J.-K. Analysis of Disparity Information for Depth Extraction Using CMOS Image Sensor with Offset Pixel Aperture Technique. Sensors 2019, 19, 472. https://doi.org/10.3390/s19030472

AMA Style

Choi B-S, Lee J, Kim S-H, Chang S, Park J, Lee S-J, Shin J-K. Analysis of Disparity Information for Depth Extraction Using CMOS Image Sensor with Offset Pixel Aperture Technique. Sensors. 2019; 19(3):472. https://doi.org/10.3390/s19030472

Chicago/Turabian Style

Choi, Byoung-Soo, Jimin Lee, Sang-Hwan Kim, Seunghyuk Chang, JongHo Park, Sang-Jin Lee, and Jang-Kyoo Shin. 2019. "Analysis of Disparity Information for Depth Extraction Using CMOS Image Sensor with Offset Pixel Aperture Technique" Sensors 19, no. 3: 472. https://doi.org/10.3390/s19030472

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