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Artola L, Youssef AA, Ducret S, Perrier F, Buiron R, Gilard O, Mekki J, Boutillier M, Hubert G, Poivey C. Update of Single Event Effects Radiation Hardness Assurance of Readout Integrated Circuit of Infrared Image Sensors at Cryogenic Temperature. Sensors. 2018; 18(7):2338. https://doi.org/10.3390/s18072338

Artola, Laurent, Ahmad Al Youssef, Samuel Ducret, Franck Perrier, Raphael Buiron, Olivier Gilard, Julien Mekki, Mathieu Boutillier, Guillaume Hubert, and Christian Poivey. 2018. "Update of Single Event Effects Radiation Hardness Assurance of Readout Integrated Circuit of Infrared Image Sensors at Cryogenic Temperature" Sensors 18, no. 7: 2338. https://doi.org/10.3390/s18072338

Artola, L., Youssef, A. A., Ducret, S., Perrier, F., Buiron, R., Gilard, O., Mekki, J., Boutillier, M., Hubert, G., & Poivey, C. (2018). Update of Single Event Effects Radiation Hardness Assurance of Readout Integrated Circuit of Infrared Image Sensors at Cryogenic Temperature. Sensors, 18(7), 2338. https://doi.org/10.3390/s18072338