Rashid, S.; Rossi, E.; Diplas, S.; Carvalho, P.A.; Pucicki, D.; Kuna, R.; Sebastiani, M.
A Critical Comparison Among High-Resolution Methods for Spatially Resolved Nano-Scale Residual Stress Analysis in Nanostructured Coatings. Int. J. Mol. Sci. 2025, 26, 3296.
https://doi.org/10.3390/ijms26073296
AMA Style
Rashid S, Rossi E, Diplas S, Carvalho PA, Pucicki D, Kuna R, Sebastiani M.
A Critical Comparison Among High-Resolution Methods for Spatially Resolved Nano-Scale Residual Stress Analysis in Nanostructured Coatings. International Journal of Molecular Sciences. 2025; 26(7):3296.
https://doi.org/10.3390/ijms26073296
Chicago/Turabian Style
Rashid, Saqib, Edoardo Rossi, Spyros Diplas, Patricia Almeida Carvalho, Damian Pucicki, Rafal Kuna, and Marco Sebastiani.
2025. "A Critical Comparison Among High-Resolution Methods for Spatially Resolved Nano-Scale Residual Stress Analysis in Nanostructured Coatings" International Journal of Molecular Sciences 26, no. 7: 3296.
https://doi.org/10.3390/ijms26073296
APA Style
Rashid, S., Rossi, E., Diplas, S., Carvalho, P. A., Pucicki, D., Kuna, R., & Sebastiani, M.
(2025). A Critical Comparison Among High-Resolution Methods for Spatially Resolved Nano-Scale Residual Stress Analysis in Nanostructured Coatings. International Journal of Molecular Sciences, 26(7), 3296.
https://doi.org/10.3390/ijms26073296