Májek, P.; Lüftinger, L.; Beisken, S.; Rattei, T.; Materna, A.
Genome-Wide Mutation Scoring for Machine-Learning-Based Antimicrobial Resistance Prediction. Int. J. Mol. Sci. 2021, 22, 13049.
https://doi.org/10.3390/ijms222313049
AMA Style
Májek P, Lüftinger L, Beisken S, Rattei T, Materna A.
Genome-Wide Mutation Scoring for Machine-Learning-Based Antimicrobial Resistance Prediction. International Journal of Molecular Sciences. 2021; 22(23):13049.
https://doi.org/10.3390/ijms222313049
Chicago/Turabian Style
Májek, Peter, Lukas Lüftinger, Stephan Beisken, Thomas Rattei, and Arne Materna.
2021. "Genome-Wide Mutation Scoring for Machine-Learning-Based Antimicrobial Resistance Prediction" International Journal of Molecular Sciences 22, no. 23: 13049.
https://doi.org/10.3390/ijms222313049
APA Style
Májek, P., Lüftinger, L., Beisken, S., Rattei, T., & Materna, A.
(2021). Genome-Wide Mutation Scoring for Machine-Learning-Based Antimicrobial Resistance Prediction. International Journal of Molecular Sciences, 22(23), 13049.
https://doi.org/10.3390/ijms222313049