Genome-Wide Mutation Scoring for Machine-Learning-Based Antimicrobial Resistance Prediction
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Májek, P.; Lüftinger, L.; Beisken, S.; Rattei, T.; Materna, A. Genome-Wide Mutation Scoring for Machine-Learning-Based Antimicrobial Resistance Prediction. Int. J. Mol. Sci. 2021, 22, 13049. https://doi.org/10.3390/ijms222313049
Májek P, Lüftinger L, Beisken S, Rattei T, Materna A. Genome-Wide Mutation Scoring for Machine-Learning-Based Antimicrobial Resistance Prediction. International Journal of Molecular Sciences. 2021; 22(23):13049. https://doi.org/10.3390/ijms222313049
Chicago/Turabian StyleMájek, Peter, Lukas Lüftinger, Stephan Beisken, Thomas Rattei, and Arne Materna. 2021. "Genome-Wide Mutation Scoring for Machine-Learning-Based Antimicrobial Resistance Prediction" International Journal of Molecular Sciences 22, no. 23: 13049. https://doi.org/10.3390/ijms222313049