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  • Article
  • Open Access
6 Citations
5,462 Views
23 Pages

Method for Keyhole-Free High-Aspect-Ratio Trench Refill by LPCVD

  • Henk-Willem Veltkamp,
  • Yves L. Janssens,
  • Meint J. de Boer,
  • Yiyuan Zhao,
  • Remco J. Wiegerink,
  • Niels R. Tas and
  • Joost C. Lötters

4 November 2022

In micro-machined micro-electromechanical systems (MEMS), refilled high-aspect-ratio trench structures are used for different applications. However, these trenches often show keyholes, which have an impact on the performance of the devices. In this p...