Remote Sensing | Offline Editorial Board Meeting Successfully Held in USA
The offline Editorial Board meeting of Remote Sensing (ISSN: 2072-4292) was successfully held on 11 December 2024 in Grand Hyatt Washington, DC, USA, bringing together leading experts and scholars in the field. This event not only served as a platform for in-depth discussions on the journal’s development but also strengthened communication and cooperation among the Editorial Board Members.
The meeting was chaired by Prof. Dr. Deepak R. Mishra, Section Editor-in-Chief of Remote Sensing, who extended a warm welcome to all the participants.
During the meeting, various key topics were discussed. The editorial team first presented an overview of the journal’s performance in 2024 from the perspectives of submission and country distribution, review and quality control, Editorial Board Members’ collaboration and promotion and outreach activities. Editorial Board Members actively engaged in the discussion, providing valuable feedback and suggestions on how to further improve the journal's quality and visibility.
One of the highlights of the meeting was the in-depth exploration of future development strategies. Members brainstormed on ways to attract more high-quality research papers and expand the journal’s international influence. They also emphasized the importance of carefully managing Special Issue projects and how Guest Editors promote them.
The success of the meeting would surely translate into positive changes for Remote Sensing in 2025. With the support of the Editorial Board, Remote Sensing is set to embark on a new journey of development, continuously improving its academic quality and making greater contributions to the academic community.
Appendix
Participation list of scholars:
- Prof. Dr. Soe Myint;
- Dr. Magaly Koch;
- Dr. Peng Fu;
- Prof. Dr. Takashi Oguchi;
- Prof. Dr. Deepak Mishra;
- Prof. Dr. Jie Shan;
- Dr. Renato Frasson;
- Prof. Dr. Shawn C. Kefauver;
- Prof. Dr. Brenden E. McNeil;
- Dr. Qiuhong Tang;
- Dr. Jonathan Jiang;
- Prof. Dr. Yuei-An Liou;
- Dr. Kim Anh Nguyen (Guest Editor).