AI-Driven Symmetry and Pattern Analysis in Image Processing: Methods and Applications

A special issue of Symmetry (ISSN 2073-8994). This special issue belongs to the section "Computer".

Deadline for manuscript submissions: 31 March 2027 | Viewed by 216

Editor


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Guest Editor
Faculty of Engineering, Professional School of Systems Engineering and Informatics, Universidad Nacional del Santa, Nuevo Chimbote, Peru
Interests: machine learning; Python; data science; computer vision; supervised learning; statistical learning; data clustering; KNN; predictive modeling

Special Issue Information

Dear Colleagues,

Recent advances in artificial intelligence, particularly deep learning, have significantly transformed image processing and computer vision. One of the fundamental aspects of visual data analysis is the concept of symmetry and asymmetry, which plays a critical role in pattern recognition, object detection, medical diagnosis, and scene understanding. From identifying anomalies in medical images to detecting structural patterns in industrial inspection and environmental monitoring, symmetry-based analysis has become increasingly relevant across multiple domains.

This Special Issue aims to explore innovative methodologies, models, and applications that leverage symmetry and asymmetry in image analysis. We welcome contributions that address theoretical foundations, algorithmic developments, and real-world implementations using machine learning, deep learning, and hybrid approaches.

Topics of interest include, but are not limited to, medical image analysis, defect detection, biometric recognition, remote sensing, and intelligent surveillance systems. By bringing together interdisciplinary research, this Special Issue seeks to advance the understanding of symmetry-aware models and their impact on modern AI-driven image processing solutions.

Dr. Alfredo Daza Vergaray
Guest Editor

Manuscript Submission Information

Manuscripts should be submitted online at www.mdpi.com by registering and logging in to this website. Once you are registered, click here to go to the submission form. Manuscripts can be submitted until the deadline. All submissions that pass pre-check are peer-reviewed. Accepted papers will be published continuously in the journal (as soon as accepted) and will be listed together on the special issue website. Research articles, review articles as well as short communications are invited. For planned papers, a title and short abstract (about 250 words) can be sent to the Editorial Office for assessment.

Submitted manuscripts should not have been published previously, nor be under consideration for publication elsewhere (except conference proceedings papers). All manuscripts are thoroughly refereed through a single-anonymized peer-review process. A guide for authors and other relevant information for submission of manuscripts is available on the Instructions for Authors page. Symmetry is an international peer-reviewed open access monthly journal published by MDPI.

Please visit the Instructions for Authors page before submitting a manuscript. The Article Processing Charge (APC) for publication in this open access journal is 2400 CHF (Swiss Francs). Submitted papers should be well formatted and use good English. Authors may use MDPI's English editing service prior to publication or during author revisions.

Keywords

  • symmetry analysis
  • image processing
  • computer vision
  • deep learning
  • pattern recognition
  • medical imaging
  • artificial intelligence
  • feature extraction
  • image classification
  • object detection

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Published Papers

This special issue is now open for submission.
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