Next-Generation X-Ray Detection and Imaging Materials and Devices
A special issue of Sensors (ISSN 1424-8220). This special issue belongs to the section "Sensing and Imaging".
Deadline for manuscript submissions: 30 June 2026 | Viewed by 1388
Special Issue Editor
Special Issue Information
Dear Colleagues,
X-ray detection is becoming increasingly important in modern society due to the growing need to look deep into materials, both animate and inanimate, with high spatiotemporal resolution and at minimal radiation doses. This calls for a material change in current X-ray detectors; however, advances in this regard stagnated for decades until halide perovskites and luminescent metal halides entered the conversation. Thanks to the fascinating optoelectronic properties encoded in their unprecedentedly diverse crystal structures, luminescent metal halides and halide perovskites have demonstrated a great potential to revolutionize current X-ray detection and imaging technologies.
The aim of this Special Issue is to provide a valuable platform to present recent edge-cutting achievements made in material and device innovation for advanced X-ray detection and imaging. This Special Issue welcomes both research and review articles, particularly those covering the following topics:
- The design and synthesis of X-ray detection materials in various forms;
- Light management for scintillator-based indirect-conversion X-ray detectors;
- Device physics in semiconductor-based direct-conversion X-ray detectors;
- High-performing radiation dosimeters;
- Optical/electronic readout-integrated multipixel X-ray imagers;
- Advanced algorithms for 3D X-ray image reconstruction;
- Demonstration of multi-scenario X-ray detection and imaging.
Prof. Dr. Xiuwen Xu
Guest Editor
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Keywords
- luminescent metal halides
- halide perovskites
- dosimeters
- flat-panel X-ray imagers
- 3D X-ray image reconstruction
- multi-scenario X-ray detection and imaging
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