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Computer Vision and Sensing Technologies for Industrial Quality Inspection: 3rd Edition

A special issue of Sensors (ISSN 1424-8220). This special issue belongs to the section "Sensing and Imaging".

Deadline for manuscript submissions: 5 December 2026 | Viewed by 547

Special Issue Editors


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Guest Editor
Department of Industrial Engineering and Management, Chaoyang University of Technology, Taichung 413310, Taiwan
Interests: computer vision; optical inspection; quality management; automated industrial inspection
Special Issues, Collections and Topics in MDPI journals

E-Mail Website
Guest Editor
Department of Computer Science and Information Engineering, Chaoyang University of Technology, Taichung 413310, Taiwan
Interests: image processing; computer vision; signal filtering; artificial intelligence; grey system with applications
Special Issues, Collections and Topics in MDPI journals

E-Mail Website
Guest Editor

Special Issue Information

Dear Colleagues,

Although quality inspections play an essential role in a successful operation today, finding effective ways to carry out them can be a challenge. Combined with advanced computer vision and sensing technologies, quality inspection can become an essential tool for various intelligent applications in smart manufacturing and production, such as object detection, classification, tracking and counting. The trend is to reach human-level precision or more in quality inspection with automation. Computer vision-based applications minimize human intervention, optimize operational efficiency and reduce labor costs. In addition, new sensing technologies have provided us with an excellent ability to measure, inspect, sort and grade products effectively and efficiently.

This Special Issue calls for research papers through use cases of artificial intelligence techniques and showcases the need to optimize algorithms, inference frameworks and hardware accelerators to obtain good performance in quality inspection. It mainly focuses on computer vision and sensing technologies for industrial quality inspection, including, but not limited to, imaging techniques, image processing methods, vision systems and system optimization. Industrial inspection papers are also welcome, such as quality inspection with machine learning and data-driven methods. Both review articles and original research papers are sought in this Special Issue.

Prof. Dr. Hong-Dar Lin
Prof. Dr. Cheng-Hsiung Hsieh
Prof. Dr. Hsin-Chieh Wu
Guest Editors

Manuscript Submission Information

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Please visit the Instructions for Authors page before submitting a manuscript. The Article Processing Charge (APC) for publication in this open access journal is 2600 CHF (Swiss Francs). Submitted papers should be well formatted and use good English. Authors may use MDPI's English editing service prior to publication or during author revisions.

Keywords

  • computer vision
  • sensing technologies
  • industrial quality inspection
  • automatic optical inspection
  • artificial intelligence techniques
  • machine learning
  • deep learning

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Published Papers (1 paper)

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Research

31 pages, 7154 KB  
Article
An Automated Vision-Based Inspection System for Metallic Lock Surface Defects Using a Transformer-Enhanced U-Net
by Hong-Dar Lin, Shun-Yan Li and Chou-Hsien Lin
Sensors 2026, 26(9), 2608; https://doi.org/10.3390/s26092608 - 23 Apr 2026
Viewed by 326
Abstract
Surface defect inspection of metallic lock components remains challenging due to strong specular reflections, low-contrast defect patterns, and geometric variability, which limit the consistency of manual inspection and conventional automated optical inspection (AOI) systems. This study presents an integrated visual inspection framework that [...] Read more.
Surface defect inspection of metallic lock components remains challenging due to strong specular reflections, low-contrast defect patterns, and geometric variability, which limit the consistency of manual inspection and conventional automated optical inspection (AOI) systems. This study presents an integrated visual inspection framework that combines controlled image acquisition with deep learning-based semantic segmentation to enable reliable and repeatable defect detection. A standardized rotational fixture with ring illumination was developed to stabilize imaging geometry, reduce reflection variability, and support consistent multi-view acquisition. A region-of-interest (ROI) masking strategy was further applied to suppress background interference and isolate the effective inspection region. At the algorithmic level, a Transformer-enhanced U-Net (TransU-Net) architecture was employed to jointly model local spatial features and global contextual dependencies, thereby improving boundary delineation and the detection of irregular surface anomalies. In addition, a boundary-aware weighted evaluation scheme was introduced to provide a more robust and application-relevant assessment by accounting for annotation uncertainty near defect edges. Experimental results demonstrate that the proposed method achieved an F1-score of 85.15%, with an average inference time of 0.3357 s per image for model prediction. Considering additional processes such as multi-view image acquisition, mechanical rotation, and preprocessing, the overall system-level inspection time is expected to be on the order of seconds per component in practical deployment. Full article
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