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Intelligent Inspection Technologies for Advanced Electronic Packaging and Other Industrial Applications

A special issue of Sensors (ISSN 1424-8220). This special issue belongs to the section "Electronic Sensors".

Deadline for manuscript submissions: 31 December 2026 | Viewed by 128

Editor

School of Aerospace Engineering, Huazhong University of Science and Technology, Wuhan 430074, China
Interests: nondestructive testing for advanced electronic packaging; infrared lock-in thermography; high-frequency ultrasonic testing; multi-source data fusion and intelligent image recognition
Special Issues, Collections and Topics in MDPI journals

Special Issue Information

Dear Colleagues,

Intelligent inspection has become a transformative force in the realm of advanced electronic packaging, driven by the imperative to ensure reliability and precision at ever-shrinking scales. The increasing complexity of 3D integration, chiplet architectures, and fan-out wafer-level packaging demands inspection systems capable of high accuracy and real-time decision-making. By leveraging artificial intelligence, machine learning, and advanced sensor fusion, these smart technologies are revolutionizing quality control, enabling predictive maintenance and closed-loop manufacturing processes. This evolution is critical for meeting the stringent requirements of next-generation devices in AI computing, 5G/6G communications, and the Internet of Things.

This Special Issue aims to present the latest developments in this rapidly evolving field. We welcome both original research papers and review articles that showcase the significant developments in these fields. Potential areas of interest include, but are not limited to, the following:

Dr. Bo Sun
Guest Editor

Manuscript Submission Information

Manuscripts should be submitted online at www.mdpi.com by registering and logging in to this website. Once you are registered, click here to go to the submission form. Manuscripts can be submitted until the deadline. All submissions that pass pre-check are peer-reviewed. Accepted papers will be published continuously in the journal (as soon as accepted) and will be listed together on the special issue website. Research articles, review articles as well as short communications are invited. For planned papers, a title and short abstract (about 250 words) can be sent to the Editorial Office for assessment.

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Please visit the Instructions for Authors page before submitting a manuscript. The Article Processing Charge (APC) for publication in this open access journal is 2600 CHF (Swiss Francs). Submitted papers should be well formatted and use good English. Authors may use MDPI's English editing service prior to publication or during author revisions.

Keywords

  • AI-driven intelligent inspection
  • nondestructive inspection
  • online inspection
  • automated optical inspection (AOI)
  • X-ray inspection
  • active thermography
  • infrared imaging
  • scanning acoustic microscopy (SAM)
  • super-resolution imaging
  • multi-source data fusion
  • 3D tomography
  • micro-defect detection
  • image recognition network
  • heterogeneous integrated advanced packaging
  • high-density electronic packaging
  • hybrid bonding
  • chiplet

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Published Papers

This special issue is now open for submission.
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