Sensors Testing and Reliability
A special issue of Sensors (ISSN 1424-8220). This special issue belongs to the section "Electronic Sensors".
Deadline for manuscript submissions: closed (30 September 2023) | Viewed by 211
Special Issue Editors
Interests: testing and reliability of digital circuits and systems; approximate computing and emergent technologies
Special Issues, Collections and Topics in MDPI journals
Special Issue Information
Dear Colleagues,
The IEEE European Test Symposium (ETS) is Europe’s premier forum for the presentation and discussion of scientific results, emerging ideas, applications, hot topics, and new trends in the area of electronic-based circuits and system testing, reliability, security, and validation.
ETS2023 (https://cas.polito.it/ETS23/#/) will be held in Saint Servolo Island (Isola di San Servolo in Italian), located a few minutes away by ferry from Piazza San Marco, Venice. The technical program of ETS 2023 addresses many trends and challenges in semiconductor design and manufacturing processes covering a range of topics spanning from analog, mixed-signal, RF, DfT, test access standards, validation, verification debug and diagnosis, test generation, fault simulation, fault tolerance, application, and evaluation. Moreover, ETS2023 added hot-topics that are now driving semiconductor business: dependable AI, AI for testing, functional safety and reliability in automotive emerging technologies, emerging architectures, security, and trust.
The conference papers which fall Sensors are invited to submit the extended versions of their manuscripts to this Special Issue for publication. Your non-conference research articles and comprehensive reviews are also welcome.
Prof. Dr. Alberto Bosio
Dr. Paolo Bernardi
Guest Editors
Manuscript Submission Information
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