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Special Issue "Analysis of Strain, Stress and Texture with Quantum Beams"
A special issue of Quantum Beam Science (ISSN 2412-382X).
Deadline for manuscript submissions: 15 August 2020.
Interests: fatigue; fracture mechanics; fractography; NDE; residual stress
Internal and residual stresses in materials have a considerable effect on material properties, including fatigue resistance, stress corrosion cracking, fracture toughness, and strength. Residual stresses are analyzed using FEM and measured using quantum beams, such as X-ray, synchrotron radiation, and neutron. In some cases, residual stresses are evaluated by the combination of FEM analysis and quantum methods. Since the penetration depth of neutron is very deep, the residual stresses inside of the structural component can be measured. Pulsed neutron beam experimental facilities have been constructed in the world. Thus, residual stresses have recently been measured using the pulsed neutron beam. However, it is necessary to prepare strain-free samples for the evaluation of residual stresses using the neutron. The most appropriate method has not been established yet. On the other hand, there is the diffraction plane dependence of elastic constants. The evaluation of residual stresses in heavily textured materials has to consider anisotropy. At the same time, it is necessary to develop measurement technology for texture. In this issue titled “Analysis of Strain, Stress and Texture with Quantum Beams”, many topics related the residual stress assessment will be discussed.
Dr. Makoto Hayashi
Prof. Dr. K. Akita
Manuscript Submission Information
Manuscripts should be submitted online at www.mdpi.com by registering and logging in to this website. Once you are registered, click here to go to the submission form. Manuscripts can be submitted until the deadline. All papers will be peer-reviewed. Accepted papers will be published continuously in the journal (as soon as accepted) and will be listed together on the special issue website. Research articles, review articles as well as short communications are invited. For planned papers, a title and short abstract (about 100 words) can be sent to the Editorial Office for announcement on this website.
Submitted manuscripts should not have been published previously, nor be under consideration for publication elsewhere (except conference proceedings papers). All manuscripts are thoroughly refereed through a single-blind peer-review process. A guide for authors and other relevant information for submission of manuscripts is available on the Instructions for Authors page. Quantum Beam Science is an international peer-reviewed open access quarterly journal published by MDPI.
Please visit the Instructions for Authors page before submitting a manuscript. The Article Processing Charge (APC) for publication in this open access journal is 1000 CHF (Swiss Francs). Submitted papers should be well formatted and use good English. Authors may use MDPI's English editing service prior to publication or during author revisions.
- Residual stress
- Residual strain
- Surface finishing
- Parts and structural components
- Residual stresses in hardly textured materials
- FEM analysis
- Complementary use of SR X-ray and neutron
- Complementary analysis using FEM analysis and quantum beam
- Novel technique for analyzing strain and stress
- Novel technique for analyzing texture
The below list represents only planned manuscripts. Some of these manuscripts have not been received by the Editorial Office yet. Papers submitted to MDPI journals are subject to peer-review.
Title: A Study on Phase Stress of Centrifugally Cast Duplex Stainless Steel by using Neutron Diffraction Method
Authors: Yun Wang
Affiliation: Hitachi Research Laboratory, Hitachi, Ltd.
Title: Double Exposure Method with Synchrotron White X-ray for Stress Evaluation of Coarse Grain Materials
Authors: K. Suzuki; A. Shiro; H. Toyokawa; C. Saji; T. Shobu
Affiliation: Niigata University; National Institutes for Quantum and Radiological Science and Technology Japan Synchrotron Radiation Research Institute Japan Atomic Energy Agency
Abstract: A stress measurement of coarse grain material is difficult using synchrotron X-ray diffraction, because the diffraction pattern from coarse grain material becomes spotty. In addition, the center of the diffraction pattern is unknown for the transmitted X-ray beam. A double exposure method is proposed as the countermeasure against this issue. In the experiment, we introduce a CdTe pixel detector. The detector is a newly developed area detector and can resolve high-energy X-rays. The strains of the coarse grain material can be measured by a combinations of the double exposure method, white synchrotron X-ray and the CdTe pixel detector. The bending stress in an austenitic stainless steel plate was measured using the proposed technique. As a result, the measured stress corresponded to the applied bending stress.