Next-Generation X-Ray Optical Technologies and Applications

Dear Colleagues,

The emergence of high-brightness X-ray light sources, including fourth-generation synchrotrons and X-ray free-electron lasers (XFELs), has revolutionized imaging capabilities, enabling unprecedented spatial, temporal, and sensitivity resolutions. These advanced sources empower cutting-edge research in battery materials, magnetic systems, chemical dynamics, and beyond. However, harnessing their full potential demands equally sophisticated X-ray optics and imaging techniques. 

Key challenges include the development of high-precision optics capable of handling ultra-intense beams—such as nano-focusing mirrors, diffractive optics for phase/polarization control, and compound refractive lenses—as well as high-resolution imaging methods reaching nanometer or even attometer scales. Addressing these needs requires innovations in the design, fabrication, and characterization of X-ray optics, including reflective mirrors, refractive lens, zone plates, and crystals. These components are critical for achieving high flux efficiency, exceptional resolution, and ultra-sensitive detection in next-generation X-ray experiments. 

This Special Issue invites contributions on novel X-ray optical technologies, advanced testing methodologies, and breakthrough imaging techniques for applications in materials science, biology, chemistry, and physics. Topics of interest include, but are not limited to, the following:

• Design and fabrication of X-ray optics, including mirrors, CRLs, diffractive optics, and crystals;
• Optical testing method for high-precision optics, including LTP, interferometer, and optical ptychography;
• X-ray at-wavelength metrology techniques, for example, grating interferometry, speckle tracking, and ptychography;
• X-ray optics system or adaptive optics enabling advanced capabilities such as achromatic imaging, polarization, and phase manipulation;
• X-ray beamline diagnostics techniques for synchrotrons and XFELs, such as wavefront sensing, spectrometer, X-ray energy detection, and beam position motor, among others;
• X-ray 2D/3D imaging techniques and applications for high-resolution and high-sensitivity measurement applications;
• Multi-modal imaging for physics, materials science, and biology, including dark-field imaging, phase imaging, magnetic imaging, and element-wise imaging.
• AI-enhanced X-ray wavefront diagnostics and imaging technologies for high-throughput and high-contrast applications, such as phase contrast imaging, coherent diffraction imaging, and microscopic imaging techniques.

Dr. Zhi Qiao
Dr. Ming Li
Guest Editors

Manuscript Submission Information

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