Electron Microscopy for Investigating Nanomaterials: Structural Analysis, Physical Properties, and Dynamic Behaviors
A Special Issue of Nanomaterials (ISSN 2079-4991) belonging to the section "Synthesis, Interfaces and Nanostructures".
Deadline for manuscript submissions: 15 February 2027 | Viewed by 112
Editors
Interests: in-situ TEM; nanomechanics
Interests: ultrafast transmission electron microscopy
Special Issues, Collections and Topics in MDPI journals
Special Issue Information
Dear Colleagues,
Nanomaterials exhibit unique mesoscopic properties—such as quantum size effects, high surface-to-volume ratios, and strong capital–energy coupling—that differ fundamentally from their bulk counterparts. Understanding these characteristics requires characterization techniques capable of probing down to the atomic scale. Electron microscopy (EM) has emerged as an indispensable cornerstone in this domain.
Recent transformative developments in transmission electron microscopy (TEM), scanning electron microscopy (SEM), and scanning transmission electron microscopy (STEM) have revolutionized nanoscience. Advanced methodologies—including spherical aberration correction, high-resolution energy-dispersive X-ray spectroscopy (EDS/EDX), electron energy-loss spectroscopy (EELS), four-dimensional (4D-STEM) imaging, and ultrafast/in situ techniques—now enable researchers to go beyond static structural determination. We can now visualize transient structural alterations, track dynamic charge/lattice configurations, map local physical fields, and observe real-time material responses under external stimuli (thermal, electrical, optical, or mechanical) at unprecedented spatial and temporal resolutions.
This Special Issue aims to gather cutting-edge theoretical and experimental contributions that showcase the critical role of advanced electron microscopy in unlocking the secrets of nanomaterials. In alignment with the interdisciplinary scope of Nanomaterials, we seek papers that do not merely present standard microscopy images, but tightly couple advanced EM characterization with the underlying synthesis protocols, fundamental physics, and targeted applications of the nanostructures.
Topic of interest for publication include, but are not limited to, the following:
Advanced Structural & Chemical Characterization: Atomic-scale imaging, structural defects, interfaces, and high-resolution chemical/elemental mapping of nanoparticles, nanowires, 2D materials, quantum dots, heterostructures, and organic–inorganic hybrids.
Probing Local Physical Properties: Application of EM techniques (such as 4D-STEM, EELS, and holography) to investigate localized electronic states, plasmonics, magnetic/electric fields, and strain distributions at the nanoscale.
Dynamic & In Situ Behaviors: Real-time monitoring of phase transitions, chemical reactions, crystal growth, and mechanical deformations using in situ or environmental EM.
Ultrafast Lattice & Electron Dynamics: Investigations utilizing ultrafast electron microscopy (UEM) and ultrafast electron diffraction (UED) to study transient states, hot carrier relaxation, and coherent phonon/lattice dynamics.
Theory, Modeling, and Data Automation: Computational modeling of electron–matter interactions, image simulations, and the integration of machine learning/Python-driven automation for large-scale EM dataset analysis.
Dr. Xiaocui Li
Dr. Wanpeng Li
Guest Editors
Manuscript Submission Information
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Keywords
- nanostructured materials
- in situ electron microscopy
- atomic-scale characterization
- structure–property relationships
- ultrafast electron/lattice dynamics
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