Applied Industrial Metrology: Methods, Uncertainties, and Challenges: 2nd Edition
A Special Issue of Metrology (ISSN 2673-8244).
Deadline for manuscript submissions: 23 February 2027 | Viewed by 774
Editor
Interests: uncertainty analysis; metrology; frequency stability; phase noise; optics; optoelectronics; calibration; international comparisons
Special Issues, Collections and Topics in MDPI journals
Special Issue Information
Dear Colleagues,
Following the success of the Special Issue “Applied Industrial Metrology: Methods, Uncertainties, and Challenges” for the journal Metrology (https://www.mdpi.com/journal/metrology/special_issues/M6F97Y1E32), we propose its second edition. This issue aims to bring together researchers from academia and industry involved in applied metrology, industrial calibration and measurement science.
We welcome contributions addressing the specificities of measurement uncertainties and industrial constraints, as well as innovative metrological approaches across various domains, including electricity and magnetism, frequency and time measurements, particle sizing and counting, dimensional and optical metrology and other related areas.
Original research articles, reviews and case studies that highlight the connection between fundamental metrology and industrial applications are particularly encouraged.
Join us in advancing the discussion on how metrology drives innovation, reliability and quality in industrial contexts.
Dr. Patrice Salzenstein
Guest Editor
Manuscript Submission Information
Manuscripts should be submitted online at www.mdpi.com by registering and logging in to this website. Once you are registered, click here to go to the submission form. Manuscripts can be submitted until the deadline. All submissions that pass pre-check are peer-reviewed. Accepted papers will be published continuously in the journal (as soon as accepted) and will be listed together on the special issue website. Research articles, review articles as well as short communications are invited. For planned papers, a title and short abstract (about 250 words) can be sent to the Editorial Office for assessment.
Submitted manuscripts should not have been published previously, nor be under consideration for publication elsewhere (except conference proceedings papers). All manuscripts are thoroughly refereed through a single-anonymized peer-review process. A guide for authors and other relevant information for submission of manuscripts is available on the Instructions for Authors page. Metrology is an international peer-reviewed open access quarterly journal published by MDPI.
Please visit the Instructions for Authors page before submitting a manuscript. The Article Processing Charge (APC) for publication in this open access journal is 1200 CHF (Swiss Francs). Submitted papers should be well formatted and use good English. Authors may use MDPI's English editing service prior to publication or during author revisions.
Keywords
- measurement uncertainty
- industrial calibration laboratories
- metrology methods
- gas flow
- particle size
- length
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