Applied Industrial Metrology: Methods, Uncertainties, and Challenges

Dear Colleagues,

We are pleased to announce a Special Issue of Metrology (MDPI) titled “Applied Industrial Metrology: Methods, Uncertainties, and Challenges”. This Issue aims to bring together researchers from academia and industry involved in applied metrology, industrial calibration, and measurement science.

We welcome contributions addressing the specificities of measurement uncertainties and industrial constraints, as well as innovative metrological approaches across various domains, including electricity and magnetism, frequency and time measurements, particle sizing and counting, dimensional and optical metrology, and other related areas.

Original research articles, reviews, and case studies that highlight the connection between fundamental metrology and industrial applications are particularly encouraged.

Join us in advancing the discussion on how metrology drives innovation, reliability, and quality in industrial contexts.

Dr. Patrice Salzenstein
Guest Editor

Manuscript Submission Information

Manuscripts should be submitted online at www.mdpi.com by registering and logging in to this website. Once you are registered, click here to go to the submission form. Manuscripts can be submitted until the deadline. All submissions that pass pre-check are peer-reviewed. Accepted papers will be published continuously in the journal (as soon as accepted) and will be listed together on the special issue website. Research articles, review articles as well as short communications are invited. For planned papers, a title and short abstract (about 100 words) can be sent to the Editorial Office for announcement on this website.

Submitted manuscripts should not have been published previously, nor be under consideration for publication elsewhere (except conference proceedings papers). All manuscripts are thoroughly refereed through a single-blind peer-review process. A guide for authors and other relevant information for submission of manuscripts is available on the Instructions for Authors page. Metrology is an international peer-reviewed open access quarterly journal published by MDPI.

Please visit the Instructions for Authors page before submitting a manuscript. The Article Processing Charge (APC) for publication in this open access journal is 1200 CHF (Swiss Francs). Submitted papers should be well formatted and use good English. Authors may use MDPI's English editing service prior to publication or during author revisions.