Metrology in Modern Measurement Systems and Sensors: Design, Application, Research and Challenges
A Special Issue of Metrology (ISSN 2673-8244).
Deadline for manuscript submissions: 31 October 2026 | Viewed by 553
Editors
Interests: advanced metering infrastructure; diagnostics; metrology; power quality; signal processing
Special Issues, Collections and Topics in MDPI journals
Interests: advanced metering infrastructure; detection of power quality disturbances; identification of disturbing loads; metrology; power quality diagnostics; power quality evaluation; power quality monitoring
Special Issues, Collections and Topics in MDPI journals
Interests: metrology; flow measurement
Special Issues, Collections and Topics in MDPI journals
Special Issue Information
Dear Colleagues,
Modern technological solutions, including those based on machine learning algorithms, require reliable, optimal and solid measurement results from sensors or entire measurement systems to function correctly, describing the variables used to make decisions or for control. This situation poses significant challenges in the metrology of modern measurement systems and sensors. Obtaining reliable data that enable the precise operation of modern technological solutions requires the development of new measurement systems and specific sensors. Almost always, achieving such a goal is preceded by long-term complementary research, the results of which allow for breakthrough achievements and open up further research areas.
This Special Issue will present the most important problems in metrology in modern measurement systems and sensors, in particular in the areas of design, application and research. It is also likely that the issues presented in this way will open up challenges related to modern measurement systems and sensors. This Special Issue will focus on the following topics:
- Measurements of physical and chemical quantities;
- Measurements in biology and medicine;
- Measurements and diagnostic systems;
- Processing of measurement signals;
- Analysis of measurement results and assessment of uncertainty;
- Modeling of measurement systems.
You may choose our Joint Special Issue in Sensors.
Dr. Piotr Kuwalek
Dr. Grzegorz Wiczyński
Prof. Dr. Mariusz Rząsa
Guest Editors
Manuscript Submission Information
Manuscripts should be submitted online at www.mdpi.com by registering and logging in to this website. Once you are registered, click here to go to the submission form. Manuscripts can be submitted until the deadline. All submissions that pass pre-check are peer-reviewed. Accepted papers will be published continuously in the journal (as soon as accepted) and will be listed together on the special issue website. Research articles, review articles as well as short communications are invited. For planned papers, a title and short abstract (about 250 words) can be sent to the Editorial Office for assessment.
Submitted manuscripts should not have been published previously, nor be under consideration for publication elsewhere (except conference proceedings papers). All manuscripts are thoroughly refereed through a single-anonymized peer-review process. A guide for authors and other relevant information for submission of manuscripts is available on the Instructions for Authors page. Metrology is an international peer-reviewed open access quarterly journal published by MDPI.
Please visit the Instructions for Authors page before submitting a manuscript. The Article Processing Charge (APC) for publication in this open access journal is 1200 CHF (Swiss Francs). Submitted papers should be well formatted and use good English. Authors may use MDPI's English editing service prior to publication or during author revisions.
Keywords
- measurements
- measurement diagnostics
- measurement infrastructure
- metrology
- signal analysis
- signal processing
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