Advances in Metrology for Artificial Intelligence and Neural Network Applications

Dear Colleagues,

This Special Issue of Metrology, “Advances in Metrology for Artificial Intelligence and Neural Network Applications”, focuses on the emerging intersection between measurement science and intelligent computational systems. Artificial intelligence (AI) and neural networks are becoming integral to research, industry, and manufacturing, and it is thus essential to facilitate the metrological characterization of data-driven models.

We seek contributions that address novel metrological methods and frameworks tailored for AI applications, exploring, for example, measurement uncertainty in data acquisition, model validation, and explainability. Topics of interest include the design of metrological infrastructures for AI-based systems, the calibration of sensors/measurement devices enhanced by machine learning, and the role of uncertainty quantification in neural network performance evaluation. Emphasis is also placed on digital metrology and data integrity, fostering cross-disciplinary contributions between metrologists and AI developers. By advancing the metrological foundation of AI technologies, this Special Issue aims to promote transparency, reproducibility, and eventual standardization across data-driven domains, contributing to the development of robust AI-based intelligent measurement systems.

Dr. Pedro M. Ramos
Dr. Egidio De Benedetto
Dr. Antonio Esposito
Guest Editors

Manuscript Submission Information

Manuscripts should be submitted online at www.mdpi.com by registering and logging in to this website. Once you are registered, click here to go to the submission form. Manuscripts can be submitted until the deadline. All submissions that pass pre-check are peer-reviewed. Accepted papers will be published continuously in the journal (as soon as accepted) and will be listed together on the special issue website. Research articles, review articles as well as short communications are invited. For planned papers, a title and short abstract (about 100 words) can be sent to the Editorial Office for announcement on this website.

Submitted manuscripts should not have been published previously, nor be under consideration for publication elsewhere (except conference proceedings papers). All manuscripts are thoroughly refereed through a single-blind peer-review process. A guide for authors and other relevant information for submission of manuscripts is available on the Instructions for Authors page. Metrology is an international peer-reviewed open access quarterly journal published by MDPI.

Please visit the Instructions for Authors page before submitting a manuscript. The Article Processing Charge (APC) for publication in this open access journal is 1200 CHF (Swiss Francs). Submitted papers should be well formatted and use good English. Authors may use MDPI's English editing service prior to publication or during author revisions.