Operando and In Situ Measurements during Manufacturing Processes
A special issue of Journal of Manufacturing and Materials Processing (ISSN 2504-4494).
Deadline for manuscript submissions: closed (31 July 2024) | Viewed by 426
Special Issue Editors
Interests: energy storage devices; additive manufacturing; X-ray and Neutron scattering; functional materials; electrically conductive polymers; electrochemistry; digital twins
Special Issues, Collections and Topics in MDPI journals
Special Issue Information
Dear Colleagues,
Manufacturing processes usually involve temperature changes and the imposition of pressure in order to shape the material into the desired product. Despite the complexities of the processes involved, it is often the case that the system has limited instrumentation to indicate the state of the process. As a consequence, optimization of these processes is made much more difficult and usually involves the detailed analysis of products post production, with the obvious challenges of trying to unravel the time history of the processing and development of the structure and morphology. The rise in intense X-ray sources at international synchrotron light sources (about 70 around the world) and the development of smart sensors for in-line monitoring has greatly increased the range of information available. This Special Issue is focused on these and any other developments which provide new information during the processing of materials including both traditional and new technologies such as additive manufacturing. The development of multiscale information during processing is an essential step in the development of multiscale digital twin technologies.
Prof. Dr. Geoffrey R. Mitchell
Dr. Wei Chen
Guest Editors
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Keywords
- operando scattering methods for manufacturing processes
- sensors for digital twins of manufacturing processes
- in-line measurement and sampling procedures, such as viscosity during manufacturing processes
- real-time process analytical techniques for manufacturing
- real-time manufacturing data collection
- manufacturing monitoring systems
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