Special Issue "Nanotechnology: Techniques and Instrumentations for Modelling and Characterization Data"

A special issue of Applied Sciences (ISSN 2076-3417). This special issue belongs to the section "Materials".

Deadline for manuscript submissions: 30 September 2020.

Special Issue Editor

Prof. Dr. Kamel Haddadi
Website
Guest Editor
University of Lille, Villeneuve-d'Ascq, France
Interests: RF nanotechnolgy; microwave/MM-wave radar; sensing techniques and systems

Special Issue Information

Dear Colleagues,

We would like to invite you to submit your work to a Special Issue on “Nanotechnology - Techniques & Instrumentations for Modelling & Characterization Data”. This is a joint special issue of Applied Sciences with an on-going Eu project - “Microwave Microscopy for Advanced and Efficient Materials Analysis and Production” and its two sister projects.
The accurate knowledge of micro- and nanoscale effects leading to unique chemical/electrical/optical/mechanical properties of materials is the key for development and quality control of the innovative nano-enabled products. Therefore, the precise and quantitative characterization techniques of the nanostructure of nanomaterials, nanosystems, and nanodevices at the nanometer scale by using advanced Instrumentations and novel techniques became a necessity. Further, various numerical modeling strategies have been developed to provide a new clarity to comprehend the structure and properties of nanomaterials.
The aim of this issue is to offer an opportunity to global in-the-filed scholars to share the novel approachs, techniques and instrumentations for modelling and characterization of nanomaterials at the nanoscale. Specifically, topics of interest for this Special Issue include (but are not limited to):

  • State of the art measurement techniques and instruments at the micro- to nanoscale level
  • Methodologies for the quantitative characterization (AFM, STM, SEM, TEM, Mass spectrometry, etc)
  • Standards for nanometer scale Characterization
  • Precision instrumentation design and theory
  • Reference materials, measurement standards, etc
  • New and emerging measurement and analysis technologies
  • New developments in modeling and simulations at the nanoscale

The core of the Special issue will consist of papers affiliated to the H2020 MMAMA project (https://www.mmama.eu/) and its collaborating partners, but additional papers are welcome. Contributions can take the form of either research papers or comprehensive review articles.

Prof. Kamel Haddadi
Guest Editor

Manuscript Submission Information

Manuscripts should be submitted online at www.mdpi.com by registering and logging in to this website. Once you are registered, click here to go to the submission form. Manuscripts can be submitted until the deadline. All papers will be peer-reviewed. Accepted papers will be published continuously in the journal (as soon as accepted) and will be listed together on the special issue website. Research articles, review articles as well as short communications are invited. For planned papers, a title and short abstract (about 100 words) can be sent to the Editorial Office for announcement on this website.

Submitted manuscripts should not have been published previously, nor be under consideration for publication elsewhere (except conference proceedings papers). All manuscripts are thoroughly refereed through a single-blind peer-review process. A guide for authors and other relevant information for submission of manuscripts is available on the Instructions for Authors page. Applied Sciences is an international peer-reviewed open access semimonthly journal published by MDPI.

Please visit the Instructions for Authors page before submitting a manuscript. The Article Processing Charge (APC) for publication in this open access journal is 1800 CHF (Swiss Francs). Submitted papers should be well formatted and use good English. Authors may use MDPI's English editing service prior to publication or during author revisions.

Published Papers

This special issue is now open for submission.
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