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Applied Sciences
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Nanotechnology: Techniques and Instrumentations for Modelling and Characterization Data
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Nanotechnology: Techniques and Instrumentations for Modelling and Characterization Data

A special issue of Applied Sciences (ISSN 2076-3417). This special issue belongs to the section "Materials Science and Engineering".

Deadline for manuscript submissions: closed (31 October 2020) | Viewed by 11658

Special Issue Editor

Dr. Kamel Haddadi

E-Mail Website
Guest Editor
Institute of Electronics, Microelectronics and Nanotechnology, University of Lille, Villeneuve-d'Ascq, France
Interests: RF nanotechnology; microwave/MM-wave radar; sensing techniques and systems
Special Issues, Collections and Topics in MDPI journals

Special Issue Information

Dear Colleagues,

We would like to invite you to submit your work to a Special Issue on “Nanotechnology - Techniques & Instrumentations for Modelling & Characterization Data”. This is a joint special issue of Applied Sciences with an on-going Eu project - “Microwave Microscopy for Advanced and Efficient Materials Analysis and Production” and its two sister projects.
The accurate knowledge of micro- and nanoscale effects leading to unique chemical/electrical/optical/mechanical properties of materials is the key for development and quality control of the innovative nano-enabled products. Therefore, the precise and quantitative characterization techniques of the nanostructure of nanomaterials, nanosystems, and nanodevices at the nanometer scale by using advanced Instrumentations and novel techniques became a necessity. Further, various numerical modeling strategies have been developed to provide a new clarity to comprehend the structure and properties of nanomaterials.
The aim of this issue is to offer an opportunity to global in-the-filed scholars to share the novel approachs, techniques and instrumentations for modelling and characterization of nanomaterials at the nanoscale. Specifically, topics of interest for this Special Issue include (but are not limited to):

  • State of the art measurement techniques and instruments at the micro- to nanoscale level
  • Methodologies for the quantitative characterization (AFM, STM, SEM, TEM, Mass spectrometry, etc)
  • Standards for nanometer scale Characterization
  • Precision instrumentation design and theory
  • Reference materials, measurement standards, etc
  • New and emerging measurement and analysis technologies
  • New developments in modeling and simulations at the nanoscale

The core of the Special issue will consist of papers affiliated to the H2020 MMAMA project (https://www.mmama.eu/) and its collaborating partners, but additional papers are welcome. Contributions can take the form of either research papers or comprehensive review articles.

Prof. Kamel Haddadi
Guest Editor

Manuscript Submission Information

Manuscripts should be submitted online at www.mdpi.com by registering and logging in to this website. Once you are registered, click here to go to the submission form. Manuscripts can be submitted until the deadline. All submissions that pass pre-check are peer-reviewed. Accepted papers will be published continuously in the journal (as soon as accepted) and will be listed together on the special issue website. Research articles, review articles as well as short communications are invited. For planned papers, a title and short abstract (about 100 words) can be sent to the Editorial Office for announcement on this website.

Submitted manuscripts should not have been published previously, nor be under consideration for publication elsewhere (except conference proceedings papers). All manuscripts are thoroughly refereed through a single-blind peer-review process. A guide for authors and other relevant information for submission of manuscripts is available on the Instructions for Authors page. Applied Sciences is an international peer-reviewed open access semimonthly journal published by MDPI.

Please visit the Instructions for Authors page before submitting a manuscript. The Article Processing Charge (APC) for publication in this open access journal is 2400 CHF (Swiss Francs). Submitted papers should be well formatted and use good English. Authors may use MDPI's English editing service prior to publication or during author revisions.

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Further information on MDPI's Special Issue policies can be found here.

Published Papers (4 papers)

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Research

15 pages, 5414 KiB  
Article
Near-Field Scanning Millimeter-Wave Microscope Operating Inside a Scanning Electron Microscope: Towards Quantitative Electrical Nanocharacterization
by Petr Polovodov, Didier Théron, Clément Lenoir, Dominique Deresmes, Sophie Eliet, Christophe Boyaval, Gilles Dambrine and Kamel Haddadi
Appl. Sci. 2021, 11(6), 2788; https://doi.org/10.3390/app11062788 - 20 Mar 2021
Cited by 2 | Viewed by 3135
Abstract
The main objectives of this work are the development of fundamental extensions to existing scanning microwave microscopy (SMM) technology to achieve quantitative complex impedance measurements at the nanoscale. We developed a SMM operating up to 67 GHz inside a scanning electron microscope, providing [...] Read more.
The main objectives of this work are the development of fundamental extensions to existing scanning microwave microscopy (SMM) technology to achieve quantitative complex impedance measurements at the nanoscale. We developed a SMM operating up to 67 GHz inside a scanning electron microscope, providing unique advantages to tackle issues commonly found in open-air SMMs. Operating in the millimeter-wave frequency range induces high collimation of the evanescent electrical fields in the vicinity of the probe apex, resulting in high spatial resolution and enhanced sensitivity. Operating in a vacuum allows for eliminating the water meniscus on the tip apex, which remains a critical issue to address modeling and quantitative analysis at the nanoscale. In addition, a microstrip probing structure was developed to ensure a transverse electromagnetic mode as close as possible to the tip apex, drastically reducing radiation effects and parasitic apex-to-ground capacitances with available SMM probes. As a demonstration, we describe a standard operating procedure for instrumentation configuration, measurements and data analysis. Measurement performance is exemplarily shown on a staircase microcapacitor sample at 30 GHz. Full article
(This article belongs to the Special Issue Nanotechnology: Techniques and Instrumentations for Modelling and Characterization Data)
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11 pages, 3425 KiB  
Article
Roll-to-Roll In-Line Implementation of Microwave Free-Space Non-Destructive Evaluation of Conductive Composite Thin Layer Materials
by Grigorios Koutsoukis, Ivan Alic, Antonios Vavouliotis, Ferry Kienberger and Kamel Haddadi
Appl. Sci. 2021, 11(1), 378; https://doi.org/10.3390/app11010378 - 2 Jan 2021
Cited by 4 | Viewed by 2476
Abstract
A free-space microwave nondestructive testing and evaluation module is developed for the low-power, non-ionizing, contactless, and real-time characterization of doped composite thin-film materials in an industrial context. The instrumentation proposed is built up with a handled vector network analyzer interfaced with corrugated horn [...] Read more.
A free-space microwave nondestructive testing and evaluation module is developed for the low-power, non-ionizing, contactless, and real-time characterization of doped composite thin-film materials in an industrial context. The instrumentation proposed is built up with a handled vector network analyzer interfaced with corrugated horn antennas to measure the near-field complex reflection S11 of planar prepreg composite materials in a roll-to-roll in-line production line. Dedicated modeling and calibrations routines are developed to extract the microwave conductivity from the measured microwave signal. Practical extraction of the radiofrequency (RF) conductivity of thin film prepreg composite materials doped with nano-powders is exemplary shown at the test frequency of 10 GHz. Full article
(This article belongs to the Special Issue Nanotechnology: Techniques and Instrumentations for Modelling and Characterization Data)
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9 pages, 2504 KiB  
Article
Advanced Modelling Techniques for Resonator Based Dielectric and Semiconductor Materials Characterization
by Arif Can Gungor, Marzena Olszewska-Placha, Malgorzata Celuch, Jasmin Smajic and Juerg Leuthold
Appl. Sci. 2020, 10(23), 8533; https://doi.org/10.3390/app10238533 - 29 Nov 2020
Cited by 3 | Viewed by 2837
Abstract
This article reports recent developments in modelling based on Finite Difference Time Domain (FDTD) and Finite Element Method (FEM) for dielectric resonator material measurement setups. In contrast to the methods of the dielectric resonator design, where analytical expansion into Bessel functions is used [...] Read more.
This article reports recent developments in modelling based on Finite Difference Time Domain (FDTD) and Finite Element Method (FEM) for dielectric resonator material measurement setups. In contrast to the methods of the dielectric resonator design, where analytical expansion into Bessel functions is used to solve the Maxwell equations, here the analytical information is used only to ensure the fixed angular variation of the fields, while in the longitudinal and radial direction space discretization is applied, that reduced the problem to 2D. Moreover, when the discretization is performed in time domain, full-wave electromagnetic solvers can be directly coupled to semiconductor drift-diffusion solvers to better understand and predict the behavior of the resonator with semiconductor-based samples. Herein, FDTD and frequency domain FEM approaches are applied to the modelling of dielectric samples and validated against the measurements within the 0.3% margin dictated by the IEC norm. Then a coupled in-house developed multiphysics time-domain FEM solver is employed in order to take the local conductivity changes under electromagnetic illumination into account. New methodologies are thereby demonstrated that open the way to new applications of the dielectric resonator measurements. Full article
(This article belongs to the Special Issue Nanotechnology: Techniques and Instrumentations for Modelling and Characterization Data)
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11 pages, 1343 KiB  
Article
Exploring the Capabilities of Scanning Microwave Microscopy to Characterize Semiconducting Polymers
by Olivier Douhéret, Didier Théron and David Moerman
Appl. Sci. 2020, 10(22), 8234; https://doi.org/10.3390/app10228234 - 20 Nov 2020
Viewed by 2512
Abstract
Standing at the meeting between solid state physics and optical spectroscopy, microwave characterization methods are efficient methods to probe electronic mechanisms and mesoscopic transport in semiconducting polymers. Scanning microwave microscopy, augmented with a Mach-Zehnder interferometer detection unit to allow for the probing of [...] Read more.
Standing at the meeting between solid state physics and optical spectroscopy, microwave characterization methods are efficient methods to probe electronic mechanisms and mesoscopic transport in semiconducting polymers. Scanning microwave microscopy, augmented with a Mach-Zehnder interferometer detection unit to allow for the probing of high impedance structures was applied on poly(3-hexylthiophene-2,5-diy) and exhibited high sensitivity while operating at the nanoscale. Provided a well-defined experiment protocol, S11 phase and amplitude signals are shown to lead simultaneously yet independently to probing the variations of the dielectric properties in the materials, i.e., conductive and capacitive properties, respectively, upon applied DC gate bias. Adjusting the operating microwave frequency can also serve to probe carrier trapping mechanisms. Full article
(This article belongs to the Special Issue Nanotechnology: Techniques and Instrumentations for Modelling and Characterization Data)
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