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Defect Evaluation and Nondestructive Testing

A special issue of Applied Sciences (ISSN 2076-3417). This special issue belongs to the section "Applied Industrial Technologies".

Deadline for manuscript submissions: 30 June 2025 | Viewed by 194

Special Issue Editors


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Guest Editor
School of Mechano-Electronic Engineering, Xidian University, Xi’an 710126, China
Interests: nondestructive testing and evaluation; sensors design; signal processing
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Guest Editor
School of Engineering, University of Edinburgh, Edinburgh EH9 3FG, UK
Interests: structural health monitoring; ultrasonic testing; signal processing; AI algorithms
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Guest Editor
College of Electronics and Informatics, Hunan University, Changsha 410082, China
Interests: thermography nondestructive testing; vibration or infrared/visual visions; physics-constrained machine learning models for thermography post processing
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Guest Editor Assistant
Energy Electricity Research Center, International Energy College, Jinan University, Zhuhai 519070, China
Interests: fault diagnosis; resource prediction; imaging and detection of multiphase flow; coupling modeling of multiphysics field

Special Issue Information

Dear Colleagues,

Defect evaluation and nondestructive testing play crucial roles in ensuring the quality, safety, and reliability of various materials and structures. As technology continues to advance, new methods and techniques are constantly emerging to improve the accuracy and efficiency of defect detection and assessment. This Special Issue aims to bring together the latest research and developments in the field of defect evaluation and nondestructive testing (NDT), promoting the exchange and development of related technologies.

Recommended topics include, but are not limited to, the following:

  1. Innovative nondestructive testing techniques:
    Advanced ultrasonic testing methods;
    Novel electromagnetic testing methods;
    Emerging optical testing methods;
    Other advanced nondestructive testing techniques.
  1. Defect characterization and evaluation:
    Analysis of defect types, sizes, shapes, and orientations using nondestructive testing methods;
    Development of quantitative defect evaluation methods based on nondestructive testing data;
    Assessment of the impact of defects on the mechanical, electrical, and thermal properties of materials and structures.
  1. Applications of defect evaluation and nondestructive testing:
    Industrial applications (e.g., aerospace, automotive, energy, etc.);
    Infrastructure inspection (e.g., bridges, buildings, pipelines, etc.);
    Biomedical applications;
    Other fields of application.
  1. Data analysis and signal processing for nondestructive testing:
    Signal processing algorithms for enhancing NDT signals;
    Machine learning and artificial intelligence in defect detection and evaluation;
    Data fusion and integration for improved NDT results;
    Uncertainty analysis and reliability assessment of NDT data.

Dr. Nan Li
Dr. Hwa Kian Chai
Dr. Hongjin Wang
Guest Editors

Dr. Shanxun Sun
Guest Editor Assistant

Manuscript Submission Information

Manuscripts should be submitted online at www.mdpi.com by registering and logging in to this website. Once you are registered, click here to go to the submission form. Manuscripts can be submitted until the deadline. All submissions that pass pre-check are peer-reviewed. Accepted papers will be published continuously in the journal (as soon as accepted) and will be listed together on the special issue website. Research articles, review articles as well as short communications are invited. For planned papers, a title and short abstract (about 100 words) can be sent to the Editorial Office for announcement on this website.

Submitted manuscripts should not have been published previously, nor be under consideration for publication elsewhere (except conference proceedings papers). All manuscripts are thoroughly refereed through a single-blind peer-review process. A guide for authors and other relevant information for submission of manuscripts is available on the Instructions for Authors page. Applied Sciences is an international peer-reviewed open access semimonthly journal published by MDPI.

Please visit the Instructions for Authors page before submitting a manuscript. The Article Processing Charge (APC) for publication in this open access journal is 2400 CHF (Swiss Francs). Submitted papers should be well formatted and use good English. Authors may use MDPI's English editing service prior to publication or during author revisions.

Keywords

  • defect detection
  • nondestructive testing and evaluation
  • impact analysis
  • defect quantification
  • smart systems
  • AI algorithms

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Published Papers

This special issue is now open for submission.
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