applsci-logo

Journal Browser

Journal Browser

Precision Measurement Technology

A special issue of Applied Sciences (ISSN 2076-3417). This special issue belongs to the section "Mechanical Engineering".

Deadline for manuscript submissions: 31 December 2025 | Viewed by 982

Special Issue Editors


E-Mail Website
Guest Editor
Manufacturing Metrology Team, Faculty of Engineering, University of Nottingham, Nottingham, UK
Interests: coordinate metrology; optical measurements; machine vision
School of Engineering & Physical Sciences, University of Lincoln, Lincoln, UK
Interests: surface metrology; advanced manufacturing; machine learning; mechatronics

E-Mail Website
Guest Editor
Department of Mechanical, Materials and Manufacturing Engineering, University of Nottingham, Nottingham NG8 1BB, UK
Interests: metrology; surface analysis; quantum technology
Special Issues, Collections and Topics in MDPI journals

Special Issue Information

Dear Colleagues,

In the current digital era of rapid technological advancement and increasing demand for accuracy and precision in manufacturing, precision measurement systems and technologies play a critical role in innovation across multiple research fields. Measurements, from the nanoscale to large scales, underpin the fundamental accuracy and reliability of scientific discoveries and modern technologies. This issue invites contributions that investigate advances in measurement techniques, instrumentation, data processing, calibration, system integration, etc. Topics of interest include, but are not limited to, innovations in sensor technologies, advanced signal processing algorithms, measurement characterisation, uncertainty evaluation, artificial intelligence-driven measurement systems, and interdisciplinary applications of precision metrology. This Special Issue seeks to foster collaboration by disseminating related research, addressing current challenges, and inspiring future directions in the field of precision measurement.

Dr. Mohammed A. Isa
Dr. Mingyu Liu
Prof. Dr. Samanta Piano
Guest Editors

Manuscript Submission Information

Manuscripts should be submitted online at www.mdpi.com by registering and logging in to this website. Once you are registered, click here to go to the submission form. Manuscripts can be submitted until the deadline. All submissions that pass pre-check are peer-reviewed. Accepted papers will be published continuously in the journal (as soon as accepted) and will be listed together on the special issue website. Research articles, review articles as well as short communications are invited. For planned papers, a title and short abstract (about 100 words) can be sent to the Editorial Office for announcement on this website.

Submitted manuscripts should not have been published previously, nor be under consideration for publication elsewhere (except conference proceedings papers). All manuscripts are thoroughly refereed through a single-blind peer-review process. A guide for authors and other relevant information for submission of manuscripts is available on the Instructions for Authors page. Applied Sciences is an international peer-reviewed open access semimonthly journal published by MDPI.

Please visit the Instructions for Authors page before submitting a manuscript. The Article Processing Charge (APC) for publication in this open access journal is 2400 CHF (Swiss Francs). Submitted papers should be well formatted and use good English. Authors may use MDPI's English editing service prior to publication or during author revisions.

Keywords

  • precision measurement
  • metrology
  • measurement
  • measurement systems
  • optical measurement
  • coordinate measurement
  • surface measurement
  • accuracy
  • smart sensors
  • quality control
  • precision engineering

Benefits of Publishing in a Special Issue

  • Ease of navigation: Grouping papers by topic helps scholars navigate broad scope journals more efficiently.
  • Greater discoverability: Special Issues support the reach and impact of scientific research. Articles in Special Issues are more discoverable and cited more frequently.
  • Expansion of research network: Special Issues facilitate connections among authors, fostering scientific collaborations.
  • External promotion: Articles in Special Issues are often promoted through the journal's social media, increasing their visibility.
  • Reprint: MDPI Books provides the opportunity to republish successful Special Issues in book format, both online and in print.

Further information on MDPI's Special Issue policies can be found here.

Published Papers (1 paper)

Order results
Result details
Select all
Export citation of selected articles as:

Review

23 pages, 7946 KB  
Review
Quantum-Enhanced Sensing with Squeezed Light: From Fundamentals to Applications
by Xing Heng, Lingchen Zhang, Qingyun Yin, Wei Liu, Lulu Tang, Yueyang Zhai and Kai Wei
Appl. Sci. 2025, 15(18), 10179; https://doi.org/10.3390/app151810179 - 18 Sep 2025
Viewed by 301
Abstract
Squeezed light, a prominent non-classical state of light, exhibits reduced quantum noise in one quadrature component below the standard quantum limit (SQL). The property enables quantum-enhanced precision measurements, surpassing the SQL in quantum sensing applications. This review comprehensively introduces the fundamental concepts, classifications, [...] Read more.
Squeezed light, a prominent non-classical state of light, exhibits reduced quantum noise in one quadrature component below the standard quantum limit (SQL). The property enables quantum-enhanced precision measurements, surpassing the SQL in quantum sensing applications. This review comprehensively introduces the fundamental concepts, classifications, and experimental generation techniques of squeezed light. It further explores its pivotal role and recent advances in diverse quantum sensing domains, including interferometry, gravitational wave detection, magnetometry, force sensing, biomedical sensing, and quantum radar. The review covers theoretical foundations of squeezed states (including quadrature operators and classification schemes, experimental generation techniques in atomic ensembles, nonlinear crystals, and fibers), fundamentals of quantum sensing with squeezed light (from quantum noise theory to quantum-enhanced metrology), and quantum-enhanced sensing applications across the aforementioned domains. Finally, future challenges and opportunities in the field are discussed. Full article
(This article belongs to the Special Issue Precision Measurement Technology)
Show Figures

Figure 1

Back to TopTop