Moreau, C.; Lemesle, J.; Páez Margarit, D.; Blateyron, F.; Bigerelle, M.
Statistical Analysis of Measurement Processes Using Multi-Physic Instruments: Insights from Stitched Maps. Metrology 2024, 4, 141-163.
https://doi.org/10.3390/metrology4020010
AMA Style
Moreau C, Lemesle J, Páez Margarit D, Blateyron F, Bigerelle M.
Statistical Analysis of Measurement Processes Using Multi-Physic Instruments: Insights from Stitched Maps. Metrology. 2024; 4(2):141-163.
https://doi.org/10.3390/metrology4020010
Chicago/Turabian Style
Moreau, Clement, Julie Lemesle, David Páez Margarit, François Blateyron, and Maxence Bigerelle.
2024. "Statistical Analysis of Measurement Processes Using Multi-Physic Instruments: Insights from Stitched Maps" Metrology 4, no. 2: 141-163.
https://doi.org/10.3390/metrology4020010
APA Style
Moreau, C., Lemesle, J., Páez Margarit, D., Blateyron, F., & Bigerelle, M.
(2024). Statistical Analysis of Measurement Processes Using Multi-Physic Instruments: Insights from Stitched Maps. Metrology, 4(2), 141-163.
https://doi.org/10.3390/metrology4020010