Ruetters, M.; Gehrig, H.; Mertens, C.; Sen, S.; Kim, T.-S.; Schlemmer, H.-P.; Ziener, C.H.; Schoenberg, S.; Froelich, M.; Kachelrieß, M.;
et al. Opportunistic Diagnostics of Dental Implants in Routine Clinical Photon-Counting CT Acquisitions. J. Imaging 2025, 11, 215.
https://doi.org/10.3390/jimaging11070215
AMA Style
Ruetters M, Gehrig H, Mertens C, Sen S, Kim T-S, Schlemmer H-P, Ziener CH, Schoenberg S, Froelich M, Kachelrieß M,
et al. Opportunistic Diagnostics of Dental Implants in Routine Clinical Photon-Counting CT Acquisitions. Journal of Imaging. 2025; 11(7):215.
https://doi.org/10.3390/jimaging11070215
Chicago/Turabian Style
Ruetters, Maurice, Holger Gehrig, Christian Mertens, Sinan Sen, Ti-Sun Kim, Heinz-Peter Schlemmer, Christian H. Ziener, Stefan Schoenberg, Matthias Froelich, Marc Kachelrieß,
and et al. 2025. "Opportunistic Diagnostics of Dental Implants in Routine Clinical Photon-Counting CT Acquisitions" Journal of Imaging 11, no. 7: 215.
https://doi.org/10.3390/jimaging11070215
APA Style
Ruetters, M., Gehrig, H., Mertens, C., Sen, S., Kim, T.-S., Schlemmer, H.-P., Ziener, C. H., Schoenberg, S., Froelich, M., Kachelrieß, M., & Sawall, S.
(2025). Opportunistic Diagnostics of Dental Implants in Routine Clinical Photon-Counting CT Acquisitions. Journal of Imaging, 11(7), 215.
https://doi.org/10.3390/jimaging11070215