Evans, R.G.; Devlieghere, E.; Keijzer, R.; Dirckx, J.J.J.; Van der Jeught, S.
Deep Learning for Single-Shot Structured Light Profilometry: A Comprehensive Dataset and Performance Analysis. J. Imaging 2024, 10, 179.
https://doi.org/10.3390/jimaging10080179
AMA Style
Evans RG, Devlieghere E, Keijzer R, Dirckx JJJ, Van der Jeught S.
Deep Learning for Single-Shot Structured Light Profilometry: A Comprehensive Dataset and Performance Analysis. Journal of Imaging. 2024; 10(8):179.
https://doi.org/10.3390/jimaging10080179
Chicago/Turabian Style
Evans, Rhys G., Ester Devlieghere, Robrecht Keijzer, Joris J. J. Dirckx, and Sam Van der Jeught.
2024. "Deep Learning for Single-Shot Structured Light Profilometry: A Comprehensive Dataset and Performance Analysis" Journal of Imaging 10, no. 8: 179.
https://doi.org/10.3390/jimaging10080179
APA Style
Evans, R. G., Devlieghere, E., Keijzer, R., Dirckx, J. J. J., & Van der Jeught, S.
(2024). Deep Learning for Single-Shot Structured Light Profilometry: A Comprehensive Dataset and Performance Analysis. Journal of Imaging, 10(8), 179.
https://doi.org/10.3390/jimaging10080179