Next Article in Journal
Approximate Solution of Higher Order Linear Differential Equations by Means of a New Rational Chebyshev Collocation Method
Previous Article in Journal
Tibial Rotation Assessment Using Artificial Neural Networks
 
 
Mathematical and Computational Applications is published by MDPI from Volume 21 Issue 1 (2016). Previous articles were published by another publisher in Open Access under a CC-BY (or CC-BY-NC-ND) licence, and they are hosted by MDPI on mdpi.com as a courtesy and upon agreement with the previous journal publisher.
Font Type:
Arial Georgia Verdana
Font Size:
Aa Aa Aa
Line Spacing:
Column Width:
Background:
Article

Improved Part Modeling in a Process Planning System

by
Ali Çalışkan
*,
Bahadlr Tantay
and
Filiz Yağcı
Agean University, Faculty of Science, Department of Math., Greece
*
Author to whom correspondence should be addressed.
Math. Comput. Appl. 1996, 1(2), 21-28; https://doi.org/10.3390/mca1020021
Published: 1 December 1996

Abstract

An expert process planning and fixturing system described in [14] is improved here by applying Boolean operations. This system uses forward planning strategy, i.e. begins with the blank part and applies some operations for each face or feature until reaching the finished part. This paper is focused on finished and intermediate part modeling within the process planning system by geometric transformations and Boolean operations.

Share and Cite

MDPI and ACS Style

Çalışkan, A.; Tantay, B.; Yağcı, F. Improved Part Modeling in a Process Planning System. Math. Comput. Appl. 1996, 1, 21-28. https://doi.org/10.3390/mca1020021

AMA Style

Çalışkan A, Tantay B, Yağcı F. Improved Part Modeling in a Process Planning System. Mathematical and Computational Applications. 1996; 1(2):21-28. https://doi.org/10.3390/mca1020021

Chicago/Turabian Style

Çalışkan, Ali, Bahadlr Tantay, and Filiz Yağcı. 1996. "Improved Part Modeling in a Process Planning System" Mathematical and Computational Applications 1, no. 2: 21-28. https://doi.org/10.3390/mca1020021

Article Metrics

Back to TopTop