Su, W.-H.;                     Chen, K.-Y.;                     Lu, L.Y.Y.;                     Huang, Y.-C.    
        Identification of Technology Diffusion by Citation and Main Paths Analysis: The Possibility of Measuring Open Innovation. J. Open Innov. Technol. Mark. Complex. 2021, 7, 104.
    https://doi.org/10.3390/joitmc7010104
    AMA Style
    
                                Su W-H,                                 Chen K-Y,                                 Lu LYY,                                 Huang Y-C.        
                Identification of Technology Diffusion by Citation and Main Paths Analysis: The Possibility of Measuring Open Innovation. Journal of Open Innovation: Technology, Market, and Complexity. 2021; 7(1):104.
        https://doi.org/10.3390/joitmc7010104
    
    Chicago/Turabian Style
    
                                Su, Wei-Hao,                                 Kai-Ying Chen,                                 Louis Y. Y. Lu,                                 and Ya-Chi Huang.        
                2021. "Identification of Technology Diffusion by Citation and Main Paths Analysis: The Possibility of Measuring Open Innovation" Journal of Open Innovation: Technology, Market, and Complexity 7, no. 1: 104.
        https://doi.org/10.3390/joitmc7010104
    
    APA Style
    
                                Su, W.-H.,                                 Chen, K.-Y.,                                 Lu, L. Y. Y.,                                 & Huang, Y.-C.        
        
        (2021). Identification of Technology Diffusion by Citation and Main Paths Analysis: The Possibility of Measuring Open Innovation. Journal of Open Innovation: Technology, Market, and Complexity, 7(1), 104.
        https://doi.org/10.3390/joitmc7010104