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Journal: Electronics, 2020
Volume: 9
Number: 414
414
Article: Exploring the Impact of Variability in Resistance Distributions of RRAM on the Prediction Accuracy of Deep Learning Neural Networks
Authors: by Nagaraj Lakshmana Prabhu, Desmond Loy Jia Jun, Putu Andhita Dananjaya, Wen Siang Lew, Eng Huat Toh and Nagarajan Raghavan
Link: https://www.mdpi.com/2079-9292/9/3/414

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