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Journal: Electronics, 2020
Volume: 9
Number: 414
Article:
Exploring the Impact of Variability in Resistance Distributions of RRAM on the Prediction Accuracy of Deep Learning Neural Networks
Authors:
by
Nagaraj Lakshmana Prabhu, Desmond Loy Jia Jun, Putu Andhita Dananjaya, Wen Siang Lew, Eng Huat Toh and Nagarajan Raghavan
Link:
https://www.mdpi.com/2079-9292/9/3/414
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