Prabhu, N.L.; Loy Jia Jun, D.; Dananjaya, P.A.; Lew, W.S.; Toh, E.H.; Raghavan, N.
Exploring the Impact of Variability in Resistance Distributions of RRAM on the Prediction Accuracy of Deep Learning Neural Networks. Electronics 2020, 9, 414.
https://doi.org/10.3390/electronics9030414
AMA Style
Prabhu NL, Loy Jia Jun D, Dananjaya PA, Lew WS, Toh EH, Raghavan N.
Exploring the Impact of Variability in Resistance Distributions of RRAM on the Prediction Accuracy of Deep Learning Neural Networks. Electronics. 2020; 9(3):414.
https://doi.org/10.3390/electronics9030414
Chicago/Turabian Style
Prabhu, Nagaraj Lakshmana, Desmond Loy Jia Jun, Putu Andhita Dananjaya, Wen Siang Lew, Eng Huat Toh, and Nagarajan Raghavan.
2020. "Exploring the Impact of Variability in Resistance Distributions of RRAM on the Prediction Accuracy of Deep Learning Neural Networks" Electronics 9, no. 3: 414.
https://doi.org/10.3390/electronics9030414
APA Style
Prabhu, N. L., Loy Jia Jun, D., Dananjaya, P. A., Lew, W. S., Toh, E. H., & Raghavan, N.
(2020). Exploring the Impact of Variability in Resistance Distributions of RRAM on the Prediction Accuracy of Deep Learning Neural Networks. Electronics, 9(3), 414.
https://doi.org/10.3390/electronics9030414