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Journal: Electronics, 2020
Volume: 9
Number: 402

Article: Field Modeling the Impact of Cracks on the Electroconductivity of Thin-Film Textronic Structures
Authors: by Stanisław Pawłowski, Jolanta Plewako and Ewa Korzeniewska
Link: https://www.mdpi.com/2079-9292/9/3/402

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