Order Article Reprints

Electronics2020, 9(12), 2039;https://doi.org/10.3390/electronics9122039

Journal: ElectronicsVolume: 9Number: 2039

Article: Instability in In_0.7Ga_0.3As Quantum-Well MOSFETs with Single-Layer Al₂O₃ and Bi-Layer Al₂O₃/HfO₂ Gate Stacks Caused by Charge Trapping under Positive Bias Temperature (PBT) Stress

Authors:
Hyuk-Min Kwon¹,
Dae-Hyun Kim^2,* and
Tae-Woo Kim^3,*

Link: https://www.mdpi.com/2079-9292/9/12/2039

MDPI offers high quality article reprints with convenient shipping to destinations worldwide. Each reprint features a 270 gsm bright white cover and 105 gsm premium white paper, bound with two stitches for durability and printed in full color. The cover design is customized to your article and designed to be complimentary to the journal.

Order Article Reprints

Order Cost and Details

Shipping Address

Billing Address