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Journal: ElectronicsVolume: 8Number: 519
Article: Proton Induced Single Event Effect Characterization on a Highly Integrated RF-Transceiver
  • Authors:
  • Jan Budroweit1,*,
  • Mattis Paul Jaksch1 and
  • Maciej Sznajder2
Link: https://www.mdpi.com/2079-9292/8/5/519

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