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Journal: Electronics, 2018
Volume: 7
Number: 208
Article:
MMIC on-Wafer Test Method Based on Hybrid Balanced and Unbalanced RF Pad Structures
Authors:
by
Yue Bian, Yifan Gu, Xu Ding, Zhiyu Wang, Jiongjiong Mo and Faxin Yu
Link:
https://www.mdpi.com/2079-9292/7/9/208
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