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Journal: ElectronicsVolume: 7Number: 208
Article: MMIC on-Wafer Test Method Based on Hybrid Balanced and Unbalanced RF Pad Structures
  • Authors:
  • Yue Bian,
  • Yifan Gu and
  • Xu Ding
  • et al.
Link: https://www.mdpi.com/2079-9292/7/9/208

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