- Article
MMIC on-Wafer Test Method Based on Hybrid Balanced and Unbalanced RF Pad Structures
- Yue Bian,
- Yifan Gu,
- Xu Ding,
- Zhiyu Wang,
- Jiongjiong Mo and
- Faxin Yu
Nowadays, more and more MMICs (Microwave Monolithic Integrated Circuit), such as limiters and switches, are designed to have balanced and unbalanced test pad structures to solve the challenging size restrictions and integration requirements for MMICs...

