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Journal: ElectronicsVolume: 7Number: 377
Article: A Comprehensive Review of Recent Progress on GaN High Electron Mobility Transistors: Devices, Fabrication and Reliability
  • Authors:
  • Fanming Zeng1,
  • Judy Xilin An1,* and
  • Guangnan Zhou1
  • et al.
Link: https://www.mdpi.com/2079-9292/7/12/377

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