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Journal: Electronics, 2018
Volume: 7
Number: 377
Article:
A Comprehensive Review of Recent Progress on GaN High Electron Mobility Transistors: Devices, Fabrication and Reliability
Authors:
by
Fanming Zeng, Judy Xilin An, Guangnan Zhou, Wenmao Li, Hui Wang, Tianli Duan, Lingli Jiang and Hongyu Yu
Link:
https://www.mdpi.com/2079-9292/7/12/377
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