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Journal: Electronics, 2018
Volume: 7
Number: 312

Article: Evaluation by Neutron Radiation of the NMR-MPar Fault-Tolerance Approach Applied to Applications Running on a 28-nm Many-Core Processor
Authors: by Vanessa Vargas, Pablo Ramos and Raoul Velazco
Link: https://www.mdpi.com/2079-9292/7/11/312

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