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Journal: ElectronicsVolume: 7Number: 312
Article: Evaluation by Neutron Radiation of the NMR-MPar Fault-Tolerance Approach Applied to Applications Running on a 28-nm Many-Core Processor
  • Authors:
  • Vanessa Vargas1,*,†,
  • Pablo Ramos1 and
  • Raoul Velazco2
Link: https://www.mdpi.com/2079-9292/7/11/312

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