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Journal: Electronics, 2025
Volume: 14
Number: 1828

Article: YOLOv8-IDX: Optimized Deep Learning Model for Transmission Line Insulator-Defect Detection
Authors: by Umer Farooq, Fan Yang, Maryam Shahzadi, Umar Ali and Zhimin Li
Link: https://www.mdpi.com/2079-9292/14/9/1828

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