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Journal: Electronics, 2025
Volume: 14
Number: 1828
Article:
YOLOv8-IDX: Optimized Deep Learning Model for Transmission Line Insulator-Defect Detection
Authors:
by
Umer Farooq, Fan Yang, Maryam Shahzadi, Umar Ali and Zhimin Li
Link:
https://www.mdpi.com/2079-9292/14/9/1828
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