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Journal: ElectronicsVolume: 14Number: 1321
Article: Surge Current Capability and Failure Modes of 650 V p-GaN Gate HEMTs: A Multiphysics Study on Thermal–Electrical Coupling Effects
- Authors:
- Kuangli Chen1,
- Rong Peng1 and
- Shuting Huang1
- et al.
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