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Journal: ElectronicsVolume: 14Number: 1296
Article: Radiation-Hardened Design and Experimental Validation Using a Mixed-Stage Model for Reliability Assessment of Integrated Circuits in Radiation Environments
  • Authors:
  • Minwoong Lee1,
  • Namho Lee1 and
  • Donghan Ki1,2
  • et al.
Link: https://www.mdpi.com/2079-9292/14/7/1296

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