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Journal: Electronics, 2025
Volume: 14
Number: 1124

Article: A Scoping Review: Applications of Deep Learning in Non-Destructive Building Tests
Authors: by Xiuli Zhang, Yifan Yu, Zeming Yu, Fugui Qiao, Jianneng Du and Hui Yao
Link: https://www.mdpi.com/2079-9292/14/6/1124

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