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Electronics2025, 14(6), 1124;https://doi.org/10.3390/electronics14061124

Journal: ElectronicsVolume: 14Number: 1124

Article: A Scoping Review: Applications of Deep Learning in Non-Destructive Building Tests

Authors:
Xiuli Zhang¹,
Yifan Yu² and
Zeming Yu¹
et al.

Link: https://www.mdpi.com/2079-9292/14/6/1124

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