Zhang, X.; Yu, Y.; Yu, Z.; Qiao, F.; Du, J.; Yao, H.
A Scoping Review: Applications of Deep Learning in Non-Destructive Building Tests. Electronics 2025, 14, 1124.
https://doi.org/10.3390/electronics14061124
AMA Style
Zhang X, Yu Y, Yu Z, Qiao F, Du J, Yao H.
A Scoping Review: Applications of Deep Learning in Non-Destructive Building Tests. Electronics. 2025; 14(6):1124.
https://doi.org/10.3390/electronics14061124
Chicago/Turabian Style
Zhang, Xiuli, Yifan Yu, Zeming Yu, Fugui Qiao, Jianneng Du, and Hui Yao.
2025. "A Scoping Review: Applications of Deep Learning in Non-Destructive Building Tests" Electronics 14, no. 6: 1124.
https://doi.org/10.3390/electronics14061124
APA Style
Zhang, X., Yu, Y., Yu, Z., Qiao, F., Du, J., & Yao, H.
(2025). A Scoping Review: Applications of Deep Learning in Non-Destructive Building Tests. Electronics, 14(6), 1124.
https://doi.org/10.3390/electronics14061124