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Journal: Electronics, 2025
Volume: 14
Number: 758

Article: 5G-TSN Integrated Prototype for Reliable Industrial Communication Using Frame Replication and Elimination for Reliability
Authors: by Pierre E. Kehl, Junaid Ansari, Mikael Lovrin, Praveen Mohanram, Chi-Chuan (Eric) Liu, Jun-Lin (Larry) Yeh and Robert H. Schmitt
Link: https://www.mdpi.com/2079-9292/14/4/758

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