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Journal: Electronics, 2025
Volume: 14
Number: 473
Article:
Total Ionizing Dose Effects in Advanced 28 nm Charge Trapping 3D NAND Flash Memory
Authors:
by
Xuesong Zheng, Yuhang Wang, Rigen Mo, Chaoming Liu, Tianqi Wang, Mingxue Huo and Liyi Xiao
Link:
https://www.mdpi.com/2079-9292/14/3/473
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