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Journal: Electronics, 2025
Volume: 14
Number: 3794

Article: A Robust AI Framework for Safety-Critical LIB Degradation Prognostics: SE-VMD and Dual-Branch GRU-Transformer
Authors: by Yang Liu, Quan Li, Jinqi Zhu, Bo Zhang and Jia Guo
Link: https://www.mdpi.com/2079-9292/14/19/3794

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