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Journal: ElectronicsVolume: 14Number: 3794
Article: A Robust AI Framework for Safety-Critical LIB Degradation Prognostics: SE-VMD and Dual-Branch GRU-Transformer
  • Authors:
  • Yang Liu1,
  • Quan Li1 and
  • Jinqi Zhu1,2,*
  • et al.
Link: https://www.mdpi.com/2079-9292/14/19/3794

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