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Journal: Electronics, 2025
Volume: 14
Number: 2982
2982
Article: Impact of Charge Carrier Trapping at the Ge/Si Interface on Charge Transport in Ge-on-Si Photodetectors
Authors: by Dongyan Zhao, Yali Shao, Shuo Zhang, Tanyi Li, Boming Chi, Yaxing Zhu, Fang Liu, Yingzong Liang and Sichao Du
Link: https://www.mdpi.com/2079-9292/14/15/2982

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