Article Versions Notes

Huang H, Wu Z, Peng C, Shen H, Wu X, Yang J, Lei Z, Cui X, Ma T, Zhang Z, et al. Comprehensive Study of Proton and Heavy Ion-Induced Damages for Cascode GaN-Based HEMTs. Electronics. 2025; 14(13):2653. https://doi.org/10.3390/electronics14132653

Huang, Huixiang, Zhipeng Wu, Chao Peng, Hanxin Shen, Xiaoqiang Wu, Jianqun Yang, Zhifeng Lei, Xiuhai Cui, Teng Ma, Zhangang Zhang, and et al. 2025. "Comprehensive Study of Proton and Heavy Ion-Induced Damages for Cascode GaN-Based HEMTs" Electronics 14, no. 13: 2653. https://doi.org/10.3390/electronics14132653

Huang, H., Wu, Z., Peng, C., Shen, H., Wu, X., Yang, J., Lei, Z., Cui, X., Ma, T., Zhang, Z., He, Y., Chen, Y., & Lu, G. (2025). Comprehensive Study of Proton and Heavy Ion-Induced Damages for Cascode GaN-Based HEMTs. Electronics, 14(13), 2653. https://doi.org/10.3390/electronics14132653