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Journal: Electronics, 2025
Volume: 14
Number: 2596
Article:
MetaGAN: Metamorphic GAN-Based Augmentation for Improving Deep Learning-Based Multiple-Fault Localization Without Test Oracles
Authors:
by
Anlin Hu, Wenjiang Feng, Xudong Zhu, Junjie Wang, Yiping Ao and Hao Feng
Link:
https://www.mdpi.com/2079-9292/14/13/2596
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